#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208170
Mfr serial number	STN12564-08170

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208170

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.0864
I_LEAK350V (microA)	0.12829
Substr Origin	239
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	70
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.94
20	40.31
30	45.95
40	50.36
50	53.98
60	57.35
70	60.95
80	64.75
90	68.43
100	71.87
110	75.05
120	78.08
130	80.97
140	83.73
150	86.4
160	88.95
170	91.37
180	93.8
190	96.16
200	98.47
210	100.71
220	102.92
230	105.06
240	107.18
250	109.24
260	111.28
270	113.23
280	115.19
290	117.14
300	119.07
310	120.98
320	122.82
330	124.66
340	126.48
350	128.29
	
#CV	
10	
15	O.L.
20	O.L.
25	2880.05
30	2483.72
35	2207.99
40	1998.94
45	1839.14
50	1712.71
55	1611.81
60	1536.56
65	1486.27
70	1456.68
75	1441.47
80	1433.76
85	1429.97
90	1427.7
95	1426.06
100	1424.87
105	1423.74
110	1422.8
115	1421.99
120	1421.07

#End of manufacturer data file