#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208172
Mfr serial number	STN12564-08172

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208172

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08449
I_LEAK350V (microA)	0.1257
Substr Origin	239
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.5
20	39.68
30	45.33
40	49.87
50	53.73
60	57.09
70	60.28
80	63.59
90	66.95
100	70.27
110	73.41
120	76.38
130	79.19
140	81.89
150	84.49
160	86.98
170	89.37
180	91.72
190	93.99
200	96.27
210	98.47
220	100.6
230	102.7
240	104.78
250	106.82
260	108.81
270	110.73
280	112.69
290	114.62
300	116.51
310	118.4
320	120.25
330	122.09
340	123.91
350	125.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2997.39
30	2584.89
35	2298.14
40	2080.75
45	1914.09
50	1781.6
55	1672.93
60	1585.94
65	1519.86
70	1476.06
75	1450.16
80	1436.46
85	1429.57
90	1425.82
95	1423.73
100	1422.24
105	1420.84
110	1420.11
115	1419.01
120	1418.15

#End of manufacturer data file