#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208174
Mfr serial number	STN12564-08174

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208174

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.0855
I_LEAK350V (microA)	0.12736
Substr Origin	240
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short	72																																							
Short	73																																							
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	30.12
20	40.44
30	46.06
40	50.49
50	54.29
60	57.69
70	60.98
80	64.38
90	67.76
100	71.11
110	74.27
120	77.28
130	80.14
140	82.86
150	85.5
160	88.04
170	90.43
180	92.84
190	95.18
200	97.5
210	99.73
220	101.92
230	104.05
240	106.16
250	108.22
260	110.25
270	112.21
280	114.16
290	116.12
300	118.04
310	119.95
320	121.85
330	123.7
340	125.55
350	127.36
	
#CV	
10	
15	O.L.
20	O.L.
25	2862.15
30	2468.53
35	2195.03
40	1987.41
45	1828.59
50	1703.2
55	1602.45
60	1527.63
65	1477.43
70	1448.27
75	1433.08
80	1425.6
85	1421.91
90	1419.72
95	1417.91
100	1416.76
105	1415.67
110	1414.65
115	1413.79
120	1413.21

#End of manufacturer data file