#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208177
Mfr serial number	STN12564-08177

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208177

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.08705
I_LEAK350V (microA)	0.13118
Substr Origin	240
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	70
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.25
20	40.68
30	46.46
40	50.91
50	54.65
60	58.11
70	61.63
80	65.26
90	68.89
100	72.42
110	75.61
120	78.74
130	81.62
140	84.32
150	87.05
160	89.71
170	92.22
180	94.77
190	97.09
200	99.53
210	101.86
220	104.22
230	106.37
240	108.61
250	110.74
260	112.89
270	114.96
280	117.23
290	119.23
300	121.1
310	123.22
320	125.27
330	127.15
340	129.35
350	131.18
	
#CV	
10	
15	O.L.
20	O.L.
25	2838.7
30	2450.52
35	2180.22
40	1975.19
45	1818.25
50	1693.92
55	1594.52
60	1520.94
65	1471.91
70	1444.24
75	1430.27
80	1423.46
85	1420.11
90	1417.64
95	1416.31
100	1415
105	1413.85
110	1413.01
115	1412.13
120	1411.37

#End of manufacturer data file