#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208200
Mfr serial number	STN12565-08200

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208200

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10167
I_LEAK350V (microA)	0.14826
Substr Origin	231
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	95
R Bias Upper (MOhm)	1.83
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.53
20	43.62
30	51.02
40	57.36
50	63.48
60	68.81
70	73.27
80	77.23
90	81.03
100	84.79
110	88.51
120	92.07
130	95.43
140	98.61
150	101.67
160	104.61
170	107.44
180	110.19
190	112.84
200	115.42
210	117.96
220	120.43
230	122.81
240	125.19
250	127.49
260	129.77
270	132
280	134.2
290	136.33
300	138.41
310	140.42
320	142.38
330	144.43
340	146.33
350	148.26
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	O.L.
35	2672.57
40	2419.5
45	2223.85
50	2066.4
55	1936.82
60	1827.83
65	1735.35
70	1656.19
75	1588.92
80	1533.71
85	1491.57
90	1461.71
95	1442.43
100	1430.91
105	1424.46
110	1421.07
115	1419.11
120	1417.61

#End of manufacturer data file