#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208247
Mfr serial number	STN12566-08247

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208247

#Test data Data section	
%DATA	
TEMPERATURE (C)	28
I_LEAK150V (microA)	0.13001
I_LEAK350V (microA)	0.1821
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	80
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.2
20	64.37
30	73.99
40	81.58
50	88.06
60	93.59
70	98.45
80	103.15
90	107.69
100	111.94
110	115.9
120	119.63
130	123.3
140	126.71
150	130.01
160	133.18
170	136.32
180	139.3
190	142.19
200	145.04
210	147.87
220	150.58
230	153.21
240	155.81
250	158.38
260	160.94
270	163.42
280	165.86
290	168.26
300	170.67
310	173
320	175.3
330	177.57
340	179.89
350	182.1
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2632.94
35	2341.24
40	2121.06
45	1952.14
50	1815.39
55	1703.3
60	1611.23
65	1538.96
70	1486.85
75	1453.19
80	1433.7
85	1423.47
90	1418.35
95	1415.54
100	1413.77
105	1412.42
110	1411.27
115	1410.48
120	1409.64

#End of manufacturer data file