#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208250
Mfr serial number	STN12566-08250

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208250

#Test data Data section	
%DATA	
TEMPERATURE (C)	28
I_LEAK150V (microA)	0.11496
I_LEAK350V (microA)	0.17155
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.72
20	52.49
30	60.19
40	66.21
50	71.25
60	76.13
70	81.23
80	86.34
90	91.17
100	95.68
110	99.86
120	103.85
130	107.77
140	111.4
150	114.96
160	118.37
170	121.8
180	125
190	128.14
200	131.24
210	134.32
220	137.26
230	140.14
240	142.95
250	145.75
260	148.55
270	151.23
280	153.87
290	156.47
300	159.11
310	161.66
320	164.18
330	166.66
340	169.19
350	171.55
	
#CV	
10	
15	O.L.
20	O.L.
25	2867.35
30	2474.27
35	2199.38
40	1992.81
45	1835.18
50	1708.68
55	1608.24
60	1532.48
65	1481.81
70	1451.57
75	1435.41
80	1427.18
85	1423.06
90	1420.58
95	1418.93
100	1417.65
105	1416.6
110	1415.57
115	1414.83
120	1414.09

#End of manufacturer data file