#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208256
Mfr serial number	STN12566-08256

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208256

#Test data Data section	
%DATA	
TEMPERATURE (C)	28
I_LEAK150V (microA)	0.11573
I_LEAK350V (microA)	0.17115
Substr Origin	246
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	80
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.41
20	52.58
30	60.58
40	66.83
50	72.25
60	77.59
70	82.71
80	87.53
90	92.17
100	96.64
110	100.79
120	104.73
130	108.61
140	112.23
150	115.73
160	119.1
170	122.47
180	125.64
190	128.74
200	131.78
210	134.81
220	137.7
230	140.53
240	143.3
250	146.02
260	148.77
270	151.42
280	154.01
290	156.57
300	159.17
310	161.65
320	164.1
330	166.55
340	168.95
350	171.15
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2700.05
35	2397.72
40	2170.25
45	1995.75
50	1854.8
55	1738.7
60	1642.64
65	1564.65
70	1505.11
75	1464.59
80	1440.12
85	1426.76
90	1419.7
95	1415.99
100	1413.99
105	1412.43
110	1411.3
115	1410.1
120	1409.36

#End of manufacturer data file