#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208264
Mfr serial number	STN12566-08264

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208264

#Test data Data section	
%DATA	
TEMPERATURE (C)	28
I_LEAK150V (microA)	0.2087
I_LEAK350V (microA)	0.2772
Substr Origin	246
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	85
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	76.5
20	105.42
30	124.07
40	139.29
50	152.03
60	162.9
70	171.7
80	178.29
90	183.6
100	188.4
110	192.9
120	197.1
130	201.2
140	205
150	208.7
160	212.2
170	215.8
180	219.1
190	222.4
200	225.5
210	228.8
220	231.9
230	234.8
240	237.8
250	240.7
260	243.6
270	246.5
280	249.2
290	252
300	254.8
310	257.5
320	260.2
330	262.9
340	266.4
350	277.2
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2772
35	2475.21
40	2248.66
45	2072.2
50	1927.56
55	1806.6
60	1704.49
65	1619.01
70	1548.64
75	1493.94
80	1456.08
85	1433.1
90	1420.13
95	1413.1
100	1409.49
105	1407.49
110	1405.99
115	1404.93
120	1404.06

#End of manufacturer data file