#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208334
Mfr serial number	STN12682-08334

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	07/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208334

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10694
I_LEAK350V (microA)	0.15858
Substr Origin	231
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	75
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.73
20	47.42
30	54.75
40	60.71
50	66.02
60	70.71
70	75.31
80	80.05
90	84.65
100	88.93
110	92.86
120	96.58
130	100.17
140	103.63
150	106.94
160	110.13
170	113.17
180	116.18
190	119.08
200	121.96
210	124.72
220	127.45
230	130.12
240	132.78
250	135.35
260	137.88
270	140.29
280	142.73
290	145.13
300	147.5
310	149.85
320	152.12
330	154.31
340	156.46
350	158.58
	
#CV	
10	
15	O.L.
20	O.L.
25	2980.11
30	2569.94
35	2282.13
40	2067.16
45	1901.71
50	1769.7
55	1662.15
60	1576.98
65	1514.68
70	1474.83
75	1452
80	1439.81
85	1433.82
90	1430.55
95	1428.39
100	1426.95
105	1425.69
110	1424.82
115	1423.88
120	1423.28

#End of manufacturer data file