#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208349
Mfr serial number	STN12682-08349

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	07/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208349

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.094
I_LEAK350V (microA)	0.13681
Substr Origin	231
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	75
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.28
20	42.26
30	48.74
40	54.22
50	58.86
60	63.11
70	67.2
80	71.24
90	75.09
100	78.7
110	82.05
120	85.23
130	88.29
140	91.2
150	94
160	96.71
170	99.25
180	101.77
190	104.25
200	106.66
210	109.01
220	111.3
230	113.53
240	115.75
250	117.88
260	120.01
270	122.03
280	124.04
290	125.96
300	127.87
310	129.74
320	131.57
330	133.31
340	135.13
350	136.81
	
#CV	
10	
15	O.L.
20	O.L.
25	2949.16
30	2546.1
35	2261.53
40	2051.04
45	1888.13
50	1757.96
55	1652.32
60	1569.41
65	1509.65
70	1471.45
75	1449.49
80	1438.32
85	1432.47
90	1429.36
95	1427.55
100	1426.1
105	1425
110	1424.12
115	1423.26
120	1422.59

#End of manufacturer data file