#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208637
Mfr serial number	STN12625-08637

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208637

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08566
I_LEAK350V (microA)	0.12666
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.71
20	41.02
30	46.55
40	50.78
50	54.34
60	57.75
70	61.32
80	64.95
90	68.42
100	71.75
110	74.75
120	77.65
130	80.42
140	83.08
150	85.66
160	88.19
170	90.56
180	92.96
190	95.28
200	97.51
210	99.71
220	101.86
230	103.97
240	106.01
250	108.04
260	110.05
270	111.99
280	113.97
290	115.87
300	117.72
310	119.56
320	121.4
330	123.22
340	124.99
350	126.66
	
#CV	
10	
15	O.L.
20	O.L.
25	2679.52
30	2313.02
35	2054.87
40	1865.33
45	1718.61
50	1604.99
55	1522.5
60	1470.29
65	1441.29
70	1427.45
75	1421.06
80	1417.76
85	1415.61
90	1414.09
95	1412.81
100	1411.72
105	1410.87
110	1409.98
115	1409.19
120	1408.41

#End of manufacturer data file