#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208642
Mfr serial number	STN12625-08642

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208642

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08724
I_LEAK350V (microA)	0.12933
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.98
20	41.58
30	47.26
40	51.61
50	55.32
60	58.81
70	62.45
80	66.1
90	69.61
100	72.97
110	76.06
120	79.04
130	81.89
140	84.65
150	87.24
160	89.79
170	92.22
180	94.68
190	97.03
200	99.39
210	101.64
220	103.86
230	106.02
240	108.15
250	110.23
260	112.3
270	114.29
280	116.27
290	118.26
300	120.19
310	122.1
320	123.97
330	125.83
340	127.62
350	129.33
	
#CV	
10	
15	O.L.
20	O.L.
25	2677.85
30	2311.13
35	2052.84
40	1863.45
45	1716.83
50	1603.72
55	1521.89
60	1470.6
65	1442.77
70	1429.76
75	1423.81
80	1420.61
85	1418.58
90	1417.09
95	1415.83
100	1414.75
105	1413.86
110	1412.99
115	1412.16
120	1411.46

#End of manufacturer data file