#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208649
Mfr serial number	STN12625-08649

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208649

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09104
I_LEAK350V (microA)	0.13393
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.87
20	43.95
30	50.03
40	54.65
50	58.57
60	62.27
70	65.9
80	69.54
90	73.13
100	76.56
110	79.72
120	82.72
130	85.59
140	88.36
150	91.04
160	93.62
170	96.1
180	98.55
190	100.96
200	103.32
210	105.62
220	107.87
230	110.08
240	112.25
250	114.38
260	116.48
270	118.48
280	120.53
290	122.55
300	124.52
310	126.48
320	128.42
330	130.31
340	132.13
350	133.93
	
#CV	
10	
15	O.L.
20	O.L.
25	2699.84
30	2329.74
35	2069.2
40	1878.34
45	1730.31
50	1615.33
55	1531.12
60	1477.47
65	1447.55
70	1432.78
75	1426.05
80	1422.47
85	1420.11
90	1418.68
95	1417.44
100	1416.08
105	1415.23
110	1414.43
115	1413.6
120	1413.02

#End of manufacturer data file