#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208652
Mfr serial number	STN12625-08652

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208652

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09079
I_LEAK350V (microA)	0.13303
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.91
20	42.46
30	48.38
40	53.08
50	57.28
60	61
70	64.79
80	68.7
90	72.48
100	75.99
110	79.27
120	82.35
130	85.28
140	88.08
150	90.79
160	93.41
170	95.89
180	98.34
190	100.75
200	103.08
210	105.35
220	107.57
230	109.79
240	111.9
250	114.01
260	116.1
270	118.11
280	120.1
290	122.11
300	124.05
310	125.94
320	127.74
330	129.54
340	131.34
350	133.03
	
#CV	
10	
15	O.L.
20	O.L.
25	2919.43
30	2519.04
35	2237.78
40	2029.42
45	1867.44
50	1737.89
55	1633.04
60	1551.11
65	1492.01
70	1453.98
75	1432.42
80	1421.65
85	1416.4
90	1413.48
95	1411.81
100	1410.4
105	1409.34
110	1408.36
115	1407.63
120	1406.8

#End of manufacturer data file