#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208655
Mfr serial number	STN12626-08655

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208655

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09573
I_LEAK350V (microA)	0.14077
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.68
20	42.75
30	49.17
40	54.11
50	58.84
60	63.4
70	67.68
80	71.97
90	75.91
100	79.75
110	83.19
120	86.55
130	89.68
140	92.77
150	95.73
160	98.48
170	101.24
180	103.92
190	106.5
200	109.04
210	111.47
220	113.95
230	116.22
240	118.62
250	120.91
260	123.05
270	125.33
280	127.36
290	129.41
300	131.37
310	133.33
320	135.25
330	137.11
340	138.97
350	140.77
	
#CV	
10	
15	O.L.
20	O.L.
25	2855.24
30	2462.97
35	2186.7
40	1983.73
45	1825.58
50	1699.26
55	1598.46
60	1522.59
65	1471.25
70	1440.94
75	1425.74
80	1418.4
85	1414.6
90	1412.41
95	1410.74
100	1409.5
105	1408.47
110	1407.57
115	1406.8
120	1406.16

#End of manufacturer data file