#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208656
Mfr serial number	STN12626-08656

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208656

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09573
I_LEAK350V (microA)	0.14192
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.41
20	43.96
30	50.26
40	55.11
50	59.35
60	63.67
70	68.02
80	72.18
90	76.16
100	79.81
110	83.3
120	86.6
130	89.75
140	92.77
150	95.73
160	98.64
170	101.3
180	104.04
190	106.62
200	109.19
210	111.73
220	114.14
230	116.6
240	118.89
250	121.26
260	123.5
270	125.68
280	127.95
290	130.03
300	132.17
310	134.12
320	136.09
330	138.07
340	139.97
350	141.92
	
#CV	
10	
15	O.L.
20	O.L.
25	2672.75
30	2306.85
35	2049.25
40	1860.34
45	1713.79
50	1601.14
55	1519.48
60	1467.52
65	1438.13
70	1423.86
75	1417.28
80	1413.86
85	1411.76
90	1410.22
95	1408.9
100	1408.05
105	1407.03
110	1406.27
115	1405.53
120	1404.83

#End of manufacturer data file