#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208657
Mfr serial number	STN12626-08657

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208657

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09626
I_LEAK350V (microA)	0.14193
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.75
20	43.08
30	49.52
40	54.79
50	59.53
60	63.86
70	68.13
80	72.36
90	76.4
100	80.17
110	83.69
120	87.06
130	90.25
140	93.29
150	96.26
160	99.11
170	101.89
180	104.6
190	107.2
200	109.75
210	112.27
220	114.71
230	117.1
240	119.46
250	121.74
260	124.01
270	126.24
280	128.36
290	130.35
300	132.36
310	134.33
320	136.27
330	138.22
340	140.08
350	141.93
	
#CV	
10	
15	O.L.
20	O.L.
25	2871.53
30	2476.28
35	2197.96
40	1993.65
45	1834.25
50	1707.32
55	1605.96
60	1529.63
65	1477.21
70	1445.15
75	1427.86
80	1419.33
85	1414.97
90	1412.43
95	1410.67
100	1409.43
105	1408.32
110	1407.37
115	1406.57
120	1405.87

#End of manufacturer data file