#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208660
Mfr serial number	STN12626-08660

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208660

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10239
I_LEAK350V (microA)	0.14912
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.5
20	44.57
30	51.66
40	57.51
50	63.26
60	68.33
70	72.74
80	77.03
90	81.32
100	85.35
110	89.15
120	92.71
130	96.08
140	99.31
150	102.39
160	105.38
170	108.24
180	111.03
190	113.75
200	116.36
210	118.91
220	121.46
230	123.87
240	126.28
250	128.65
260	130.98
270	133.19
280	135.31
290	137.4
300	139.44
310	141.43
320	143.44
330	145.39
340	147.25
350	149.12
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2636.74
35	2341.14
40	2123.53
45	1953.14
50	1816.63
55	1704.62
60	1612.91
65	1539.74
70	1485.92
75	1451.25
80	1430.26
85	1419.55
90	1414.05
95	1410.98
100	1409.05
105	1407.67
110	1406.81
115	1406.01
120	1405.17

#End of manufacturer data file