#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208662
Mfr serial number	STN12626-08662

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208662

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10047
I_LEAK350V (microA)	0.14686
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	437																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.92
20	43.62
30	50.45
40	56.21
50	61.78
60	66.69
70	71.13
80	75.45
90	79.68
100	83.68
110	87.37
120	90.92
130	94.22
140	97.38
150	100.47
160	103.45
170	106.26
180	109.07
190	111.78
200	114.33
210	116.91
220	119.43
230	121.86
240	124.26
250	126.6
260	128.86
270	130.98
280	133.08
290	135.18
300	137.2
310	139.18
320	141.11
330	143.08
340	144.96
350	146.86
	
#CV	
10	
15	O.L.
20	O.L.
25	2980
30	2570.17
35	2281.51
40	2069.16
45	1903.3
50	1770.75
55	1662.43
60	1576.01
65	1510.51
70	1466.54
75	1440.94
80	1427.51
85	1420.81
90	1417.25
95	1415.13
100	1413.64
105	1412.53
110	1411.62
115	1410.72
120	1410.05

#End of manufacturer data file