#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208667
Mfr serial number	STN12626-08667

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208667

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1093
I_LEAK350V (microA)	0.16276
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.06
20	47.92
30	55.2
40	61.1
50	66.37
60	71.16
70	75.96
80	81.1
90	85.94
100	90.48
110	94.61
120	98.58
130	102.28
140	105.83
150	109.3
160	112.6
170	115.82
180	118.96
190	121.96
200	124.98
210	127.8
220	130.7
230	133.45
240	136.09
250	138.81
260	141.35
270	143.96
280	146.44
290	148.9
300	151.41
310	153.75
320	156.06
330	158.32
340	160.59
350	162.76
	
#CV	
10	
15	O.L.
20	O.L.
25	2869.68
30	2475.22
35	2198.45
40	1993.19
45	1833.72
50	1706.88
55	1605.19
60	1528.38
65	1476.34
70	1445.9
75	1430.22
80	1422.6
85	1418.83
90	1416.43
95	1414.93
100	1413.76
105	1412.56
110	1411.57
115	1410.74
120	1410.05

#End of manufacturer data file