#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208669
Mfr serial number	STN12626-08669

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208669

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10845
I_LEAK350V (microA)	0.16122
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.86
20	47.68
30	55
40	60.72
50	65.78
60	70.79
70	75.86
80	80.84
90	85.56
100	89.95
110	94.04
120	97.91
130	101.57
140	105.06
150	108.45
160	111.71
170	114.89
180	117.98
190	120.96
200	123.88
210	126.74
220	129.53
230	132.25
240	134.93
250	137.56
260	140.11
270	142.65
280	145.14
290	147.59
300	150.03
310	152.39
320	154.64
330	156.88
340	159.05
350	161.22
	
#CV	
10	
15	O.L.
20	O.L.
25	2900.87
30	2502.54
35	2223.42
40	2015.97
45	1855.16
50	1726.83
55	1622.86
60	1542.91
65	1486.41
70	1451
75	1431.57
80	1422.02
85	1417.06
90	1414.18
95	1412.44
100	1411.09
105	1410.14
110	1408.97
115	1408.32
120	1407.44

#End of manufacturer data file