#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208670
Mfr serial number	STN12626-08670

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208670

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10517
I_LEAK350V (microA)	0.15634
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	667																																							
Pinhole	683																																							
Pinhole	685																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	34
20	46.54
30	53.65
40	59.2
50	64.25
60	68.77
70	73.36
80	78.22
90	82.87
100	87.18
110	91.19
120	94.92
130	98.5
140	101.89
150	105.17
160	108.35
170	111.41
180	114.42
190	117.32
200	120.15
210	122.93
220	125.64
230	128.28
240	130.89
250	133.43
260	135.95
270	138.41
280	140.81
290	143.22
300	145.55
310	147.81
320	149.96
330	152.12
340	154.22
350	156.34
	
#CV	
10	
15	O.L.
20	O.L.
25	2893.96
30	2494.59
35	2214.15
40	2006.73
45	1846.01
50	1717.94
55	1614.74
60	1535.46
65	1480.31
70	1446.42
75	1428.89
80	1420.36
85	1415.96
90	1413.59
95	1411.8
100	1410.44
105	1409.47
110	1408.68
115	1407.86
120	1407.05

#End of manufacturer data file