#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208673
Mfr serial number	STN12626-08673

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208673

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09315
I_LEAK350V (microA)	0.14353
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.09
20	42.16
30	48.36
40	53.31
50	57.64
60	61.76
70	65.83
80	70.03
90	73.92
100	77.6
110	80.98
120	84.25
130	87.32
140	90.28
150	93.15
160	95.95
170	98.66
180	101.33
190	103.92
200	106.45
210	108.98
220	111.44
230	113.88
240	116.31
250	118.7
260	121.1
270	123.5
280	125.86
290	128.23
300	130.63
310	133
320	135.51
330	138.09
340	140.73
350	143.53
	
#CV	
10	
15	O.L.
20	O.L.
25	2876.19
30	2480.31
35	2202.78
40	1996.91
45	1837.36
50	1710.27
55	1608.38
60	1531.57
65	1478.64
70	1446.72
75	1429.51
80	1421.12
85	1416.66
90	1414.12
95	1412.3
100	1410.87
105	1409.8
110	1408.94
115	1408.05
120	1407.49

#End of manufacturer data file