#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208676
Mfr serial number	STN12626-08676

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208676

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09233
I_LEAK350V (microA)	0.13645
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.59
20	42.09
30	48.33
40	53.29
50	57.64
60	61.49
70	65.31
80	69.3
90	73.3
100	76.93
110	80.39
120	83.6
130	86.6
140	89.52
150	92.33
160	95.06
170	97.77
180	100.36
190	102.78
200	105.27
210	107.74
220	110.01
230	112.24
240	114.58
250	116.77
260	118.95
270	120.98
280	123.1
290	125.21
300	127.16
310	129.03
320	131
330	132.9
340	134.72
350	136.45
	
#CV	
10	
15	O.L.
20	O.L.
25	2885.65
30	2485.7
35	2207.17
40	2001.28
45	1840.2
50	1711.74
55	1608.74
60	1530.43
65	1475.7
70	1442.12
75	1424.36
80	1415.62
85	1411.41
90	1408.95
95	1407.41
100	1406.2
105	1405.08
110	1404.37
115	1403.51
120	1402.61

#End of manufacturer data file