#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208677
Mfr serial number	STN12626-08677

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208677

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09394
I_LEAK350V (microA)	0.14058
Substr Origin	243
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.29
20	42.41
30	48.58
40	53.49
50	57.82
60	61.98
70	66.13
80	70.26
90	74.31
100	78
110	81.51
120	84.84
130	87.96
140	91.01
150	93.94
160	96.83
170	99.47
180	102.08
190	104.67
200	107.16
210	109.69
220	112.13
230	114.43
240	116.69
250	118.97
260	121.32
270	123.49
280	125.65
290	127.87
300	130.03
310	132.12
320	134.27
330	136.31
340	138.45
350	140.58
	
#CV	
10	
15	O.L.
20	O.L.
25	2892.08
30	2491.4
35	2210.05
40	2003.27
45	1842.08
50	1713.71
55	1610.33
60	1531.66
65	1476.6
70	1443.24
75	1425.6
80	1416.77
85	1412.64
90	1409.95
95	1408.22
100	1406.88
105	1405.82
110	1405.02
115	1404.16
120	1403.28

#End of manufacturer data file