#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208734
Mfr serial number	STN12627-08734

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208734

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09263
I_LEAK350V (microA)	0.13765
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.09
20	41.25
30	47.59
40	52.58
50	56.87
60	60.88
70	65
80	69.15
90	73.13
100	76.83
110	80.32
120	83.61
130	86.74
140	89.7
150	92.63
160	95.42
170	98.15
180	100.8
190	103.36
200	105.91
210	108.32
220	110.75
230	113.1
240	115.41
250	117.69
260	119.89
270	122.07
280	124.21
290	126.2
300	128.23
310	130.16
320	132.07
330	134.02
340	135.8
350	137.65
	
#CV	
10	
15	O.L.
20	O.L.
25	2681.03
30	2314.42
35	2055.82
40	1866.41
45	1720.31
50	1608.07
55	1526.81
60	1475.18
65	1446.68
70	1432.94
75	1426.32
80	1423.09
85	1421.1
90	1419.38
95	1418.26
100	1417.11
105	1416.23
110	1415.36
115	1414.64
120	1413.94

#End of manufacturer data file