#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208735
Mfr serial number	STN12627-08735

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208735

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08795
I_LEAK350V (microA)	0.13047
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	70
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.02
20	39.82
30	45.76
40	50.43
50	54.49
60	58.28
70	62.2
80	66.08
90	69.78
100	73.22
110	76.44
120	79.51
130	82.43
140	85.23
150	87.95
160	90.59
170	93.14
180	95.65
190	98.06
200	100.4
210	102.73
220	104.99
230	107.21
240	109.39
250	111.5
260	113.61
270	115.67
280	117.67
290	119.62
300	121.52
310	123.36
320	125.2
330	127.01
340	128.74
350	130.47
	
#CV	
10	
15	O.L.
20	O.L.
25	2699.11
30	2329.72
35	2069.59
40	1878.54
45	1730.7
50	1616.54
55	1532.03
60	1476.68
65	1445.33
70	1429.41
75	1421.92
80	1418.31
85	1415.81
90	1414.27
95	1413.04
100	1411.9
105	1410.81
110	1410.17
115	1409.31
120	1408.71

#End of manufacturer data file