#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208736
Mfr serial number	STN12627-08736

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208736

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.0879
I_LEAK350V (microA)	0.12991
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.25
20	40.05
30	46.04
40	50.75
50	54.79
60	58.54
70	62.34
80	66.18
90	69.82
100	73.27
110	76.46
120	79.52
130	82.42
140	85.19
150	87.9
160	90.49
170	93.03
180	95.47
190	97.89
200	100.22
210	102.53
220	104.77
230	106.94
240	109.11
250	111.21
260	113.29
270	115.31
280	117.28
290	119.2
300	121.06
310	122.91
320	124.7
330	126.49
340	128.19
350	129.91
	
#CV	
10	
15	O.L.
20	O.L.
25	2663.89
30	2299.8
35	2043.66
40	1855.88
45	1710.93
50	1600.27
55	1520.09
60	1468.83
65	1440.25
70	1426.13
75	1419.46
80	1415.76
85	1413.92
90	1412.22
95	1411.04
100	1409.73
105	1408.95
110	1408.4
115	1407.34
120	1406.91

#End of manufacturer data file