#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208740
Mfr serial number	STN12627-08740

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208740

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08944
I_LEAK350V (microA)	0.13296
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	21																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.28
20	40.65
30	46.67
40	51.4
50	55.48
60	59.34
70	63.23
80	67.13
90	70.9
100	74.43
110	77.71
120	80.85
130	83.81
140	86.71
150	89.44
160	92.16
170	94.74
180	97.29
190	99.81
200	102.16
210	104.58
220	106.85
230	109.13
240	111.36
250	113.53
260	115.68
270	117.73
280	119.85
290	121.82
300	123.78
310	125.69
320	127.52
330	129.43
340	131.16
350	132.96
	
#CV	
10	
15	O.L.
20	O.L.
25	2646.09
30	2284.28
35	2029.95
40	1843.07
45	1699.15
50	1589.56
55	1511.33
60	1463.11
65	1437.07
70	1424.5
75	1418.23
80	1415.18
85	1413.33
90	1411.67
95	1410.6
100	1409.48
105	1408.66
110	1407.65
115	1406.82
120	1406.48

#End of manufacturer data file