#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208745
Mfr serial number	STN12627-08745

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208745

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09093
I_LEAK350V (microA)	0.13418
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.58
20	40.47
30	46.56
40	51.53
50	55.8
60	60.08
70	64.19
80	68.24
90	72.14
100	75.65
110	79.06
120	82.14
130	85.24
140	88.07
150	90.93
160	93.6
170	96.26
180	98.84
190	101.27
200	103.74
210	106.09
220	108.44
230	110.68
240	112.91
250	115.12
260	117.21
270	119.28
280	121.27
290	123.19
300	125.13
310	126.95
320	128.79
330	130.65
340	132.39
350	134.18
	
#CV	
10	
15	O.L.
20	O.L.
25	2650.53
30	2287.84
35	2032.53
40	1845.27
45	1700.63
50	1590.3
55	1511.62
60	1462.6
65	1436.16
70	1423.34
75	1417.65
80	1414.71
85	1412.62
90	1411.27
95	1410.08
100	1408.93
105	1408.01
110	1407.43
115	1406.45
120	1405.72

#End of manufacturer data file