#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208747
Mfr serial number	STN12627-08747

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208747

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09427
I_LEAK350V (microA)	0.13853
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.97
20	42.51
30	49.11
40	54.37
50	59.02
60	63.24
70	67.32
80	71.34
90	75.2
100	78.85
110	82.2
120	85.46
130	88.48
140	91.44
150	94.27
160	97.02
170	99.71
180	102.26
190	104.79
200	107.27
210	109.66
220	112.03
230	114.32
240	116.59
250	118.82
260	121
270	123.14
280	125.22
290	127.21
300	129.19
310	131.12
320	133.02
330	134.92
340	136.72
350	138.53
	
#CV	
10	
15	O.L.
20	O.L.
25	2951.45
30	2546.76
35	2260.16
40	2049.75
45	1885.98
50	1755.3
55	1648.22
60	1563.47
65	1500.91
70	1460.43
75	1437.1
80	1425.25
85	1419.54
90	1416.25
95	1414.3
100	1412.87
105	1411.94
110	1411.01
115	1410.4
120	1409.36

#End of manufacturer data file