#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208750
Mfr serial number	STN12627-08750

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208750

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.07705
I_LEAK350V (microA)	0.11413
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	27.43
20	35.5
30	40.67
40	44.79
50	48.21
60	51.43
70	54.69
80	57.94
90	61.14
100	64.14
110	66.97
120	69.65
130	72.21
140	74.66
150	77.05
160	79.35
170	81.58
180	83.77
190	85.88
200	87.94
210	89.99
220	91.98
230	93.92
240	95.82
250	97.69
260	99.53
270	101.31
280	103.03
290	104.69
300	106.33
310	107.96
320	109.5
330	111.11
340	112.61
350	114.13
	
#CV	
10	
15	O.L.
20	O.L.
25	2596.35
30	2241.63
35	1992.44
40	1809.58
45	1669.43
50	1564.56
55	1493.12
60	1451.79
65	1431.03
70	1421.24
75	1416.71
80	1414.19
85	1412.4
90	1410.91
95	1409.97
100	1408.84
105	1407.81
110	1407.28
115	1406.42
120	1405.89

#End of manufacturer data file