#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208756
Mfr serial number	STN12628-08756

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900208756

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11577
I_LEAK350V (microA)	0.17599
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.51

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39
20	52.99
30	61.05
40	67.54
50	73.19
60	78.08
70	82.77
80	87.46
90	91.9
100	96.81
110	101.34
120	105.25
130	109.81
140	113.46
150	115.77
160	119.82
170	124.09
180	127.58
190	130.2
200	133.3
210	136.67
220	139.68
230	143.89
240	147.28
250	150.75
260	152.04
270	157.32
280	161
290	163.52
300	167.68
310	167.83
320	172.79
330	175.52
340	175.75
350	175.99
	
#CV	
10	
15	O.L.
20	O.L.
25	2828.04
30	2442.03
35	2170.45
40	1966.48
45	1810.12
50	1685.79
55	1588.19
60	1517.7
65	1472.61
70	1446.26
75	1433.1
80	1426.19
85	1422.58
90	1420.43
95	1419.08
100	1417.68
105	1416.59
110	1416.01
115	1414.9
120	1414.18

#End of manufacturer data file