#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208757
Mfr serial number	STN12628-08757

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900208757

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11774
I_LEAK350V (microA)	0.17452
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.51

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.6
20	55.05
30	63.19
40	69.66
50	75.08
60	79.91
70	84.57
80	89.21
90	93.76
100	98.22
110	102.45
120	106.54
130	110.43
140	114.16
150	117.74
160	121.17
170	124.43
180	127.68
190	130.82
200	133.93
210	136.97
220	139.94
230	142.83
240	145.72
250	148.52
260	151.28
270	153.9
280	156.6
290	159.27
300	161.88
310	164.46
320	167.02
330	169.51
340	172.06
350	174.52
	
#CV	
10	
15	O.L.
20	O.L.
25	2771.32
30	2391.93
35	2125.71
40	1926.18
45	1773.32
50	1653.13
55	1561.47
60	1497.65
65	1459.17
70	1438.8
75	1428.92
80	1423.88
85	1421.28
90	1419.32
95	1417.87
100	1416.86
105	1415.58
110	1414.82
115	1414.17
120	1413.35

#End of manufacturer data file