#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208760
Mfr serial number	STN12628-08760

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900208760

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11086
I_LEAK350V (microA)	0.16415
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.51

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.27
20	51.96
30	59.81
40	66.14
50	71.24
60	75.61
70	79.82
80	84.09
90	88.29
100	92.45
110	96.44
120	100.29
130	103.96
140	107.47
150	110.86
160	114.08
170	117.15
180	120.19
190	123.14
200	126.06
210	128.9
220	131.68
230	134.41
240	137.09
250	139.72
260	142.32
270	144.82
280	147.37
290	149.87
300	152.33
310	154.75
320	157.17
330	159.55
340	161.85
350	164.15
	
#CV	
10	
15	O.L.
20	O.L.
25	2877.75
30	2481.51
35	2203.47
40	1994.98
45	1835.54
50	1708.14
55	1606.33
60	1529.3
65	1477.14
70	1446.36
75	1430.28
80	1422.61
85	1418.47
90	1416.33
95	1414.59
100	1413.06
105	1412.1
110	1411.31
115	1410.44
120	1409.5

#End of manufacturer data file