#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208767
Mfr serial number	STN12628-08767

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900208767

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.16189
I_LEAK350V (microA)	0.2521
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.51

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	53.25
20	72.65
30	83.66
40	92.32
50	99.69
60	106.55
70	113.45
80	120.18
90	126.77
100	133.12
110	139.22
120	145.27
130	150.97
140	156.56
150	161.89
160	167.07
170	172.08
180	177.15
190	182.1
200	187
210	191.6
220	196.4
230	200.8
240	205.4
250	209.8
260	214.4
270	218.5
280	222.8
290	227
300	231.3
310	235.6
320	239.5
330	243.8
340	248.1
350	252.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2545.56
30	2199.25
35	1955.01
40	1773.99
45	1638.9
50	1542.36
55	1480.51
60	1447.58
65	1432.02
70	1424.76
75	1421.3
80	1419.11
85	1417.39
90	1415.91
95	1414.62
100	1413.7
105	1412.85
110	1411.92
115	1411.12
120	1410.35

#End of manufacturer data file