#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208770
Mfr serial number	STN12628-08770

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900208770

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11138
I_LEAK350V (microA)	0.1684
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.51

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.72
20	50.29
30	57.98
40	64.29
50	69.37
60	73.98
70	78.59
80	83.07
90	87.48
100	91.69
110	95.87
120	100.01
130	104
140	107.76
150	111.38
160	114.84
170	118.11
180	121.39
190	124.54
200	127.66
210	130.68
220	133.67
230	136.59
240	139.46
250	142.27
260	145.04
270	147.71
280	150.38
290	153.04
300	155.67
310	158.24
320	160.82
330	163.37
340	165.9
350	168.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2643.73
30	2282.65
35	2028.28
40	1839.49
45	1696.33
50	1587.81
55	1511.82
60	1465.36
65	1439.89
70	1427.84
75	1422.23
80	1419.21
85	1417.46
90	1415.94
95	1414.68
100	1413.57
105	1412.6
110	1411.61
115	1410.93
120	1410.31

#End of manufacturer data file