#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208779
Mfr serial number	STN12628-08779

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900208779

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11608
I_LEAK350V (microA)	0.17438
Substr Origin	245
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.51

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.19
20	52.99
30	61.31
40	67.97
50	73.55
60	78.35
70	82.94
80	87.72
90	92.45
100	97.01
110	101.18
120	105.05
130	108.89
140	112.64
150	116.08
160	119.78
170	123.16
180	126.48
190	129.76
200	132.92
210	136.01
220	139.04
230	142.03
240	144.96
250	147.81
260	150.68
270	153.4
280	156.12
290	158.83
300	161.5
310	164.12
320	166.75
330	169.31
340	171.87
350	174.38
	
#CV	
10	
15	O.L.
20	O.L.
25	2984.57
30	2574.27
35	2286.68
40	2070.85
45	1905.28
50	1772.97
55	1664.99
60	1578.79
65	1513.14
70	1468.54
75	1441.5
80	1426.75
85	1419.3
90	1415.28
95	1412.99
100	1411.35
105	1410.14
110	1409.09
115	1408.22
120	1407.43

#End of manufacturer data file