#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208850
Mfr serial number	STN12634-08850

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208850

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08748
I_LEAK350V (microA)	0.12842
Substr Origin	257
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	80
R Bias Upper (MOhm)	1.37
R Bias Lower (MOhm)	1.24

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.83
20	42.26
30	48.14
40	52.71
50	56.48
60	59.86
70	63.16
80	66.57
90	70.01
100	73.37
110	76.5
120	79.46
130	82.26
140	84.93
150	87.48
160	89.98
170	92.31
180	94.62
190	96.93
200	99.17
210	101.35
220	103.49
230	105.58
240	107.67
250	109.72
260	111.73
270	113.64
280	115.57
290	117.53
300	119.45
310	121.3
320	123.13
330	124.95
340	126.69
350	128.42
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2677.46
35	2376.52
40	2150.89
45	1977.26
50	1838.08
55	1724.52
60	1631.96
65	1558.77
70	1505.15
75	1468.7
80	1445.76
85	1432.41
90	1425.22
95	1421.28
100	1418.94
105	1417.32
110	1416.13
115	1415.15
120	1414.26

#End of manufacturer data file