#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208867
Mfr serial number	STN12636-08867

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208867

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.07889
I_LEAK350V (microA)	0.11915
Substr Origin	244
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	28.32
20	37.64
30	42.57
40	46.29
50	49.43
60	52.44
70	55.66
80	58.99
90	62.25
100	65.37
110	68.32
120	71.12
130	73.8
140	76.39
150	78.89
160	81.33
170	83.64
180	85.94
190	88.17
200	90.39
210	92.53
220	94.63
230	96.72
240	98.76
250	100.78
260	102.75
270	104.61
280	106.6
290	108.41
300	110.33
310	112.16
320	113.94
330	115.69
340	117.45
350	119.15
	
#CV	
10	
15	O.L.
20	O.L.
25	2683.32
30	2318.69
35	2061.68
40	1872.07
45	1725.76
50	1612.34
55	1529.81
60	1476.77
65	1446.97
70	1432.48
75	1425.72
80	1422.19
85	1419.99
90	1418.35
95	1416.99
100	1415.85
105	1414.85
110	1414
115	1413.13
120	1412.38

#End of manufacturer data file