#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208870
Mfr serial number	STN12636-08870

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208870

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08121
I_LEAK350V (microA)	0.12346
Substr Origin	244
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	39																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	28.72
20	38.8
30	43.75
40	47.5
50	50.72
60	53.84
70	57.18
80	60.61
90	63.94
100	67.15
110	70.14
120	73.05
130	75.86
140	78.56
150	81.21
160	83.73
170	86.09
180	88.46
190	90.75
200	93.05
210	95.27
220	97.48
230	99.65
240	101.79
250	103.9
260	106.02
270	107.98
280	110.06
290	112.07
300	114.11
310	116.06
320	117.96
330	119.82
340	121.63
350	123.46
	
#CV	
10	
15	O.L.
20	O.L.
25	2634.45
30	2275.8
35	2023.49
40	1837.34
45	1694.31
50	1585.95
55	1510.82
60	1465.47
65	1441.45
70	1429.99
75	1424.53
80	1421.48
85	1419.46
90	1417.93
95	1416.56
100	1415.48
105	1414.47
110	1413.59
115	1412.78
120	1411.98

#End of manufacturer data file