#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208877
Mfr serial number	STN12636-08877

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208877

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.07265
I_LEAK350V (microA)	0.1084
Substr Origin	244
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	27.02
20	35.31
30	39.9
40	43.38
50	46.29
60	48.94
70	51.71
80	54.72
90	57.7
100	60.54
110	63.14
120	65.67
130	68.08
140	70.4
150	72.65
160	74.8
170	76.83
180	78.84
190	80.8
200	82.77
210	84.65
220	86.52
230	88.33
240	90.14
250	91.96
260	93.72
270	95.42
280	97.18
290	98.86
300	100.49
310	102.15
320	103.74
330	105.33
340	106.87
350	108.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2900.97
30	2503.67
35	2224.05
40	2017.4
45	1857.17
50	1729.37
55	1627.19
60	1548.87
65	1493.82
70	1459.57
75	1440.54
80	1430.86
85	1426.03
90	1423.32
95	1421.4
100	1420.01
105	1418.81
110	1417.94
115	1417.07
120	1416.15

#End of manufacturer data file