#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208887
Mfr serial number	STN12636-08887

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208887

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.07353
I_LEAK350V (microA)	0.11039
Substr Origin	244
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	26.53
20	34.72
30	39.27
40	42.76
50	45.73
60	48.51
70	51.4
80	54.54
90	57.72
100	60.77
110	63.6
120	66.25
130	68.78
140	71.21
150	73.53
160	75.78
170	77.9
180	80.02
190	82.08
200	84.13
210	86.08
220	88.02
230	88.63
240	91.78
250	93.66
260	95.48
270	97.2
280	98.97
290	100.7
300	102.42
310	104.08
320	105.68
330	107.3
340	108.83
350	110.39
	
#CV	
10	
15	O.L.
20	O.L.
25	2918.96
30	2517.23
35	2234.76
40	2026.26
45	1864.51
50	1735.28
55	1631.19
60	1550.18
65	1491.88
70	1454.65
75	1433.61
80	1422.72
85	1417.28
90	1414.26
95	1412.36
100	1410.94
105	1409.71
110	1408.97
115	1408.08
120	1407.23

#End of manufacturer data file