#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208888
Mfr serial number	STN12636-08888

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208888

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.07151
I_LEAK350V (microA)	0.10805
Substr Origin	244
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	70
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	26.08
20	34.21
30	38.57
40	41.86
50	44.69
60	47.39
70	50.29
80	53.33
90	56.34
100	59.18
110	61.85
120	64.41
130	66.85
140	69.21
150	71.51
160	73.72
170	75.8
180	77.91
190	79.92
200	81.94
210	83.9
220	85.86
230	87.76
240	89.62
250	91.44
260	93.24
270	94.98
280	96.71
290	98.45
300	100.13
310	101.81
320	103.44
330	105.02
340	106.54
350	108.05
	
#CV	
10	
15	O.L.
20	O.L.
25	2757.98
30	2379.45
35	2113.54
40	1917.43
45	1766.02
50	1647.72
55	1558.68
60	1497.53
65	1460.01
70	1439.77
75	1429.66
80	1424.67
85	1421.87
90	1420.03
95	1418.57
100	1417.35
105	1416.29
110	1415.5
115	1414.72
120	1413.91

#End of manufacturer data file