#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900209114
Mfr serial number	STN12762-09114

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	16/04/2002
PROBLEM	NO
PASSED	YES
Run number	20220900209114

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12149
I_LEAK350V (microA)	0.17915
Substr Origin	249
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.2

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42
20	55.05
30	63.49
40	70.32
50	76.3
60	81.74
70	87.01
80	92.17
90	97.12
100	101.79
110	106.13
120	110.21
130	114.14
140	117.88
150	121.49
160	124.97
170	128.28
180	131.55
190	134.76
200	137.93
210	140.96
220	144
230	146.95
240	149.9
250	152.74
260	155.58
270	158.31
280	161
290	163.73
300	166.35
310	169.03
320	171.61
330	174.2
340	176.74
350	179.15
	
#CV	
10	
15	O.L.
20	O.L.
25	2894.93
30	2494.07
35	2213.02
40	2002.09
45	1840.32
50	1711.73
55	1610.9
60	1535.39
65	1482.61
70	1448.89
75	1429.27
80	1418.88
85	1413.63
90	1410.8
95	1409.04
100	1407.81
105	1406.81
110	1406.08
115	1405.43
120	1404.7

#End of manufacturer data file