#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900209117
Mfr serial number	STN12762-09117

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	16/04/2002
PROBLEM	NO
PASSED	YES
Run number	20220900209117

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12113
I_LEAK350V (microA)	0.17806
Substr Origin	249
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.2

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	608																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.91
20	54.79
30	63.14
40	69.93
50	75.84
60	81.19
70	86.39
80	91.61
90	96.61
100	101.34
110	105.7
120	109.81
130	113.73
140	117.5
150	121.13
160	124.63
170	127.94
180	131.21
190	134.42
200	137.62
210	140.71
220	143.65
230	146.58
240	149.48
250	152.26
260	155.04
270	157.7
280	160.43
290	163.09
300	165.72
310	168.3
320	170.81
330	173.26
340	175.7
350	178.06
	
#CV	
10	
15	O.L.
20	O.L.
25	2894.18
30	2494.41
35	2213.94
40	2004.04
45	1842.63
50	1714.93
55	1614.88
60	1540.11
65	1488.16
70	1455.52
75	1437.2
80	1427.72
85	1422.96
90	1420.28
95	1418.57
100	1417.31
105	1416.35
110	1415.54
115	1414.86
120	1414.15

#End of manufacturer data file