#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900209884
Mfr serial number	STN12912-09884

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/05/2002
PROBLEM	NO
PASSED	YES
Run number	20220900209884

#Test data Data section	
%DATA	
TEMPERATURE (C)	29
I_LEAK150V (microA)	0.15452
I_LEAK350V (microA)	0.2297
Substr Origin	261
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.64
R Bias Lower (MOhm)	1.46

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.23
20	69.56
30	81.15
40	90.23
50	97.87
60	104.83
70	111.46
80	117.83
90	123.89
100	129.63
110	134.99
120	140.13
130	145.16
140	149.89
150	154.52
160	158.97
170	163.42
180	167.66
190	171.81
200	175.89
210	179.97
220	183.8
230	187.7
240	191.5
250	195.2
260	198.9
270	202.4
280	206
290	209.5
300	213
310	216.4
320	219.8
330	223.1
340	226.4
350	229.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2949.58
30	2542.06
35	2257.34
40	2042.75
45	1878.71
50	1746.69
55	1640.56
60	1558.13
65	1499.05
70	1460.23
75	1436.95
80	1424.02
85	1417.39
90	1413.83
95	1411.72
100	1410.25
105	1409.03
110	1408.19
115	1407.25
120	1406.52

#End of manufacturer data file