#General information ITEM section %ITEM SERIAL NUMBER 20220900210010 Mfr serial number STN12914-10010 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 28/05/2002 PROBLEM NO PASSED YES Run number 20220900210010 #Test data Data section %DATA TEMPERATURE (C) 27 I_LEAK150V (microA) 0.08281 I_LEAK350V (microA) 0.11969 Substr Origin 262 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 292 Vdep (V) 70 R Bias Upper (MOhm) 1.46 R Bias Lower (MOhm) 1.31 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 28.49 20 38.35 30 43.64 40 48.04 50 52.08 60 55.86 70 59.53 80 63.08 90 66.4 100 69.53 110 72.47 120 75.22 130 77.86 140 80.37 150 82.81 160 85.09 170 87.4 180 89.61 190 91.76 200 93.87 210 95.92 220 97.92 230 99.87 240 101.75 250 103.55 260 105.26 270 106.93 280 108.65 290 110.31 300 111.93 310 113.55 320 115.11 330 116.67 340 118.2 350 119.69 #CV 10 15 O.L. 20 O.L. 25 2640.34 30 2275.25 35 2020.12 40 1832.55 45 1690.85 50 1584.22 55 1508.91 60 1460.16 65 1431.34 70 1415.66 75 1407.49 80 1403.29 85 1400.92 90 1399.26 95 1398.05 100 1397.17 105 1396.3 110 1395.57 115 1394.91 120 1394.41 #End of manufacturer data file