#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900210197
Mfr serial number	STN12924-10197

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	05/06/2002
PROBLEM	NO
PASSED	YES
Run number	20220900210197

#Test data Data section	
%DATA	
TEMPERATURE (C)	28
I_LEAK150V (microA)	0.15192
I_LEAK350V (microA)	0.2264
Substr Origin	264
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.42

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.78
20	66.98
30	77.85
40	86.31
50	93.46
60	100.33
70	107.19
80	113.91
90	120.37
100	126.38
110	132.03
120	137.37
130	142.41
140	147.24
150	151.92
160	156.44
170	160.84
180	165.11
190	169.27
200	173.34
210	177.35
220	181.2
230	184.9
240	188.8
250	192.4
260	196
270	199.6
280	203.1
290	206.5
300	209.9
310	213.3
320	216.6
330	220
340	223.2
350	226.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2983.01
30	2568.57
35	2279.33
40	2061.66
45	1893.58
50	1759.62
55	1650.97
60	1566.06
65	1503.96
70	1462.99
75	1438.6
80	1425.21
85	1418.39
90	1414.97
95	1412.75
100	1411.34
105	1410.23
110	1409.37
115	1408.36
120	1407.71

#End of manufacturer data file